JEOL 6100 SEM

High resolution Scanning Electron Microscope with:

• Oxford Instruments Cryo-stage imaging of frozen, fully hydrated specimens

• Oxford instruments Inca X-Ray micro-analysis suite providing full analytical capability, including: quantitative elemental analysis, element mapping

 

 

JEOL 5600 Low Vacuum SEM

High resolution Scanning Electron Microscope which operates in conventional high vacuum and low vacuum modes. Low Vacuum mode: allows observation of non-conducting, uncoated specimens.

Low temperature stage in low vacuum mode: maintains integrity of hydrated samples such as biological specimens and foodstuffs.

 

 

JEOL 1200 TEM

High resolution 120Kv Transmission Electron Microscope for applications in both materials and life sciences. With integrated digital image capture and SIS Image analysis software suite.

A range of bright field, dark field, phase contrast, and DIC Light Microscopy with digital image capture is available at the Centre, with associated image processing and analysis software for both PC and Macintosh computers for all digital image formats.

In addition to the standard range of specimen preparation instrumentation, the EMC is equipped with a freeze substitution unit for low temperature processing of biological materials, and applications in immuno-labelling.